Now showing items 1-2 of 2

    • A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection 

      Zhang, Bin; Sconyers, Chris; Byington, Carl; Patrick, Romano; Orchard Concha, Marcos; Vachtsevanos, George (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2011-05)
      This paper introduces a method to detect a fault associated with critical components/subsystems of an engineered system. It is required, in this case, to detect the fault condition as early as possible, with specified ...
    • A novel blind deconvolution de-noising scheme in failure prognosis 

      Zhang, Bin; Khawaja, Taimoor; Patrick, Romano; Vachtsevanos, George; Orchard Concha, Marcos; Saxena, Abhinav (2010)
      With increased system complexity, condition-based maintenance (CBM) becomes a promising solution for system safety by detecting faults and scheduling maintenance procedures before faults become severe failures resulting ...