Now showing items 2461-2480 of 21728

    • Vives M.V., Chamorro H.R., Ortiz-Villalba D., Jiménez F., Gonzalez-Longatt F.M., Jimenez-Estevez G., Guerrero J., Cadena A., Sood V.K. (Institution of Engineering and Technology, 2020)
    • Strunck C., Rehtanz C., Espin-Sarzosa D., Palma-Behnke R. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Abdelhamid M., Kamel S., Mohamed M.A., Aljohani M., Rahmann C., Mosaad M.I. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • De Pater I., Luszcz-Cook S., Rojo P., Redwing E., De Kleer K., Moullet A. (Web Portal IOP, 2020)
    • Joshi, YV; Musalem, A (INFORMS Inst.for Operations Res.and the Management Sciences, 2021)
    • Close L.M., Males J., Long J.D., Van Gorkom K., Hedglen A.D., Kautz M., Lumbres J., Haffert S.Y., Follette K., Wagner K., Miller K., Apai D., Wu Y.-L., Guyon O., Schatz L., Rodack A., Doelman D., Snik F., Knight J.M., Morzinski K., Gasho V., Keller C., Pearce L., Weinberger A., Pérez L., Doyon R. (SPIE, 2020)
    • Milli J., Rojas T., Courtney-Barrer B., Bian F., Navarrete J., Kerber F., Otarola A. (SPIE, 2020)
    • Sandini G., Ruiz-Del-Solar J. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Acciari, VA; Ansoldi, S; Antonelli, LA; Engels, AA; Babic, A; Banerjee, B; de Almeida, UB; Barrio, JA; Gonzalez, JB; Bednarek, W; Bellizzi, L; Bernardini, E; Berti, A; Besenrieder, J; Bhattacharyya, W; Bigongiari, C; Blanch, O; Bonnoli, G; Bosnjak, Z; Busetto, G; Carosi, R; Ceribella, G; Cerruti, M; Chai, Y; Chilingaryan, A; Cikota, S; Colak, SM; Colin, U; Colombo, E; Contreras, JL; Cortina, J; Covino, S; D'Elia, V; Da Vela, P; Dazzi, F; De Angelis, A; De Lotto, B; Delfino, M; Delgado, J; Depaoli, D; Di Pierro, F; Di Venere, L; Espineira, ED; Prester, DD; Donini, A; Doro, M; Elsaesser, D; Ramazani, VF; Fattorini, A; Ferrara, G; Foffano, L; Fonseca, MV; Font, L; Fruck, C; Fukami, S; Lopez, RJG; Garczarczyk, M; Gasparyan, S; Gaug, M; Giglietto, N; Giordano, F; Godinovic, N; Gliwny, P; Green, D; Hadasch, D; Hahn, A; Herrera, J; Hoang, J; Hrupec, D; Hutten, M; Inada, T; Inoue, S; Ishio, K; Iwamura, Y; Jouvin, L; Kajiwara, Y; Kerszberg, D; Kobayashi, Y; Kubo, H; Kushida, J; Lamastra, A; Lelas, D; Leone, F; Lindfors, E; Lombardi, S; Longo, F; Lopez, M; Lopez-Coto, R; Lopez-Oramas, A; Loporchio, S; Fraga, BMD; Maggio, C; Majumdar, P; Makariev, M; Mallamaci, M; Maneva, G; Manganaro, M; Maraschi, L; Mariotti, M; Martinez, M; Mazin, D; Mender, S; Micanovic, S; Miceli, D; Miener, T; Minev, M; Miranda, JM; Mirzoyan, R; Molina, E; Moralejo, A; Morcuende, D; Moreno, V; Moretti, E; Munar-Adrover, P; Neustroev, V; Nigro, C; Nilsson, K; Ninci, D; Nishijima, K; Noda, K; Nogues, L; Nozaki, S; Ohtani, Y; Oka, T; Otero-Santos, J; Paiano, S; Palatiello, M; Paneque, D; Paoletti, R; Paredes, JM; Pavletic, L; Penil, P; Peresano, M; Persic, M; Moroni, PGP; Prandini, E; Puljak, I; Rib, M; Rico, J; Righi, C; Rugliancich, A; Saha, L; Sahakyan, N; Saito, T; Sakurai, S; Satalecka, K; Schleicher, B; Schmidt, K; Schweizer, T; Sitarek, J; Snidaric, I; Sobczynska, D; Spolon, A; Stamerra, A; Strom, D; Strzys, M; Suda, Y; Suric, T; Takahashi, M; Tavecchio, F; Temnikov, P; Terzic, T; Teshima, M; Torres-Alba, N; Tosti, L; van Scherpenberg, J; Vanzo, G; Acosta, MV; Ventura, S; Verguilov, V; Vigorito, CF; Vitale, V; Vovk, I; Will, M; Baack, D; Balbo, M; Beck, M; Biederbeck, N; Biland, A; Blank, M; Bretz, T; Bruegge, K; Bulinski, M; Buss, J; Doerr, M; Dorner, D; Hildebrand, D; Iotov, R; Klinger, M; Mannheim, K; Mueller, SA; Neise, D; Neronov, A; Nothe, M; Paravac, A; Rhode, W; Schleicher, B; Sedlaczek, K; Shukla, A; Sliusar, V; Tani, L; Theissen, F; Walter, R; Pulido, JA; Filippenko, AV; Hovatta, T; Kiehlmann, S; Larionov, VM; Max-Moerbeck, W; Raiteri, CM; Readhead, ACS; Segon, M; Villata, M; Zheng, W (Oxford University Press, 2021)
    • Gai M., Qi Z., Lattanzi M.G., Bucciarelli B., Busonero D., Crosta M., Landini F., Liao S., Luo H., Mana G., Mendez R.A., Pisani M., Riva A., San Martin Luque C.I.J., Sasso C.P., Tang Z., Vecchiato A., Yong Y. (SPIE, 2020)
    • Yoshii Y., Doi M., Miyata T., Kohno K., Tanaka M., Minezaki T., Sako S., Morokuma T., Tanabe T., Hatsukade B., Konishi M., Kamizuka T., Asano K., Sameshima H., Kato N., Numata M., Takahashi H., Aoki T., Soyano T., Tarusawa K., Yoshikawa K., Motohara K., Tamura Y., Koshida S., Handa T., Bronfman L., Ruiz M., Hamuy M., Mendez R., Escala A. (SPIE, 2020)
    • Yoshikawa K., Yoshii Y., Doi M., Miyata T., Kohno K., Tanaka M., Motohara K., Minezaki T., Sako S., Morokuma T., Tanabe T., Hatsukade B., Konishi M., Takahashi H., Kamizuka T., Sameshima H., Kato N., Numata M., Aoki T., Soyano T., Tarusawa K., Schorghofer N., Mena G. (SPIE, 2020)
    • Ren X., Astudillo P., Graf U.U., Hills R.E., Jorquera S., Nikolic B., Parshley S.C., Reyes N., Weikert L. (SPIE, 2020)
    • Herbst T.M., Bilgi P., Bizenberger P., Blanc G., Briegel F., Case S., Drory N., Feger T., Froning C., Gaessler W., Hebert A., Konidaris N., Lanz A., Mohr L., Pak S., Ramirez S., Rohloff R.-R., Sánchez-Gallego J., Wachter S. (SPIE, 2020)
    • Vidaure A.C., Lopez E.C., Alcocer J.P.S., Bergel A. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Benalcazar D.P., Montecino D.A., Zambrano J.E., Perez C.A., Bowyer K.W. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Ho-Quang T., Bergel A., Nurwidyantoro A., Jolak R., Chaudron M.R.V. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Perez J.I.A., Castro-Linares R., Duarte-Mermoud M.A. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Aiola, S; Calabrese, E; Maurin, L; Naess, S; Schmitt, BL; Abitbol, MH; Addison, GE; Ade, PAR; Alonso, D; Amiri, M; Amodeo, S; Angile, E; Austermann, JE; Baildon, T; Battaglia, N; Beall, JA; Bean, R; Becker, DT; Bond, JR; Bruno, SM; Calafut, V; Campusano, LE; Carrero, F; Chesmore, GE; Cho, HM; Choi, SK; Clark, SE; Cothard, NF; Crichton, D; Crowley, KT; Darwish, O; Datta, R; Denison, EV; Devlin, MJ; Duell, CJ; Duff, SM; Duivenvoorden, AJ; Dunkley, J; Dunner, R; Essinger-Hileman, T; Fankhanel, M; Ferraro, S; Fox, AE; Fuzia, B; Gallardo, PA; Gluscevic, V; Golec, JE; Grace, E; Gralla, M; Guan, YL; Hall, K; Halpern, M; Han, D; Hargrave, P; Hasselfield, M; Helton, JM; Henderson, S; Hensley, B; Hill, JC; Hilton, GC; Hilton, M; Hincks, AD; Hlozek, R; Ho, SPP; Hubmayr, J; Huffenberger, KM; Hughes, JP; Infante, L; Irwin, K; Jackson, R; Klein, J; Knowles, K; Koopman, B; Kosowsky, A; Lakey, V; Li, DL; Li, YQ; Li, Z; Lokken, M; Louis, T; Lungu, M; MacInnis, A; Madhavacheril, M; Maldonado, F; Mallaby-Kay, M; Marsden, D; McMahon, J; Menanteau, F; Moodley, K; Morton, T; Namikawa, T; Nati, F; Newburgh, L; Nibarger, JP; Nicola, A; Niemack, MD; Nolta, MR; Orlowski-Sherer, J; Page, LA; Pappas, CG; Partridge, B; Phakathi, P; Pisano, G; Prince, H; Puddu, R; Qu, FJ; Rivera, J; Robertson, N; Rojas, F; Salatino, M; Schaan, E; Schillaci, A; Sehgal, N; Sherwin, BD; Sierra, C; Sievers, J; Sifon, C; Sikhosana, P; Simon, S; Spergel, DN; Staggs, ST; Stevens, J; Storer, E; Sunder, DD; Switzer, ER; Thorne, B; Thornton, R; Trac, H; Treu, J; Tucker, C; Vale, LR; Van Engelen, A; Van Lanen, J; Vavagiakis, EM; Wagoner, K; Wang, YH; Ward, JT; Wollack, EJ; Xu, ZL; Zago, F; Zhu, NF (IOP Publishing Ltd, 2020)