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    • Cazorla, Manuel; Aldana, Samuel; Maestro, Marcos; González, Mireia Bargalló; Campabadal, Francesca; Silva Moreno, Enrique Esteban; Jiménez-Molinos, Francisco; Roldán, Juan Bautista (AVS Science and Technology Society, 2019)
      An in-depth analysis including both simulation and experimental characterization of resistive random access memories (RRAMs) with dielectric stacks composed of two layers of HfO 2 and Al 2 O 3 stacked in different orders ...