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    • Zhang, Bin; Sconyers, Chris; Byington, Carl; Patrick, Romano; Orchard Concha, Marcos; Vachtsevanos, George (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2011-05)
      This paper introduces a method to detect a fault associated with critical components/subsystems of an engineered system. It is required, in this case, to detect the fault condition as early as possible, with specified ...