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Authordc.contributor.authorMoraga, Luis 
Authordc.contributor.authorArenas, Claudio 
Authordc.contributor.authorHenríquez, Ricardo 
Authordc.contributor.authorSolís, Basilio 
Admission datedc.date.accessioned2015-09-04T15:38:07Z
Available datedc.date.available2015-09-04T15:38:07Z
Publication datedc.date.issued2015
Cita de ítemdc.identifier.citationPhys. Status Solidi B 252, No. 1, 219–229 (2015)en_US
Identifierdc.identifier.otherDOI 10.1002/pssb.201451202
Identifierdc.identifier.urihttps://repositorio.uchile.cl/handle/2250/133417
General notedc.descriptionArtículo de publicación ISIen_US
Abstractdc.description.abstractWe report a new formula for the electrical conductivity of a thin wire of rectangular cross-section, obtained from an exact solution of the Boltzmann equation by assuming perfectly diffuse surface scattering and absence of grain boundaries. Also, we calculate the electrical conductivity of polycrystalline metallic wires, both for the case of rectangular and circular cross-sections and for arbitrary values of Fuchs' specularity parameter, by means of a seminumerical procedure that solves the Boltzmann equation by summing over classical trajectories in accordance with Chambers' method. Following Szczyrbowski and Schmalzbauer, the scattering by grain boundaries is represented by a peculiar specularity parameter and a boundary transmittance. The difference between one and the sum of these two probabilities measures the probability of diffuse scattering. We examine the dependence of the conductivity on the values of these parameters and the effects of disorder on the diameters of the grains.en_US
Patrocinadordc.description.sponsorshipFONDECYT 1120198en_US
Lenguagedc.language.isoen_USen_US
Publisherdc.publisherWileyen_US
Type of licensedc.rightsAtribución-NoComercial-SinDerivadas 3.0 Chile*
Link to Licensedc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/*
Keywordsdc.subjectElectrical conductivityen_US
Keywordsdc.subjectGrain boundariesen_US
Keywordsdc.subjectSurface roughnessen_US
Keywordsdc.subjectThin metallic wiresen_US
Títulodc.titleThe effect of surface roughness and grain-boundary scattering on the electrical conductivity of thin metallic wiresen_US
Document typedc.typeArtículo de revista


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Atribución-NoComercial-SinDerivadas 3.0 Chile
Except where otherwise noted, this item's license is described as Atribución-NoComercial-SinDerivadas 3.0 Chile