Show simple item record

Authordc.contributor.authorVerzijl, C. 
Authordc.contributor.authorGil, J. A. C. 
Authordc.contributor.authorPerrin, M. 
Authordc.contributor.authorDulic, Diana 
Authordc.contributor.authorVan der Zant, H. 
Authordc.contributor.authorThijssen, J. 
Admission datedc.date.accessioned2015-12-30T01:38:14Z
Available datedc.date.available2015-12-30T01:38:14Z
Publication datedc.date.issued2015
Cita de ítemdc.identifier.citationJournal of Chemical Physics Volumen: 143 Número: 17 Nov. 2015en_US
Identifierdc.identifier.issn0021-9606
Identifierdc.identifier.otherDOI: 10.1063/1.4934882
Identifierdc.identifier.urihttps://repositorio.uchile.cl/handle/2250/136062
General notedc.descriptionArtículo de publicación ISIen_US
General notedc.descriptionSin acceso a texto completo
Abstractdc.description.abstractWe present a method for incorporating image-charge effects into the description of charge transport through molecular devices. A simple model allows us to calculate the adjustment of the transport levels, due to the polarization of the electrodes as charge is added to and removed from the molecule. For this, we use the charge distributions of the molecule between two metal electrodes in several charge states, rather than in gas phase, as obtained from a density-functional theory-based transport code. This enables us to efficiently model level shifts and gap renormalization caused by image-charge effects, which are essential for understanding molecular transport experiments. We apply the method to benzene di-amine molecules and compare our results with the standard approach based on gas phase charges. Finally, we give a detailed account of the application of our approach to porphyrin-derivative devices recently studied experimentally by Perrin et al. [Nat. Nanotechnol. 8, 282 (2013)], which demonstrates the importance of accounting for image-charge effects when modeling transport through molecular junctionsen_US
Patrocinadordc.description.sponsorshipDutch Foundation for Fundamental Research on Matter (FOM) EU Netherlands' National Computing Facilities Foundation - Netherlands Organization for Scientific Research (NWO)en_US
Lenguagedc.language.isoenen_US
Publisherdc.publisherAmerican Institute of Physicsen_US
Type of licensedc.rightsAtribución-NoComercial-SinDerivadas 3.0 Chile*
Link to Licensedc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/*
Keywordsdc.subjectEnergy-Level Alignment
Keywordsdc.subjectSingle-Electron Transistor
Keywordsdc.subjectCharge Neutrality Level
Keywordsdc.subjectOrganic Interfaces
Keywordsdc.subjectDipole Formation
Keywordsdc.subjectJunctions
Keywordsdc.subjectDevice
Keywordsdc.subjectStates
Títulodc.titleImage effects in transport at metal-molecule interfacesen_US
Document typedc.typeArtículo de revista


Files in this item

Icon

This item appears in the following Collection(s)

Show simple item record

Atribución-NoComercial-SinDerivadas 3.0 Chile
Except where otherwise noted, this item's license is described as Atribución-NoComercial-SinDerivadas 3.0 Chile