Analysis of Deterioration in a Plasma Focus Device
Author
dc.contributor.author
Zanelli, Daniel
Author
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López, Enrique
Author
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Pavez, Cristian
Author
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Pedreros, José
Author
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Jain, Jalaj
Author
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Avaria, Gonzalo
Author
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Moreno, José
Author
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Bora, Biswajit
Author
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Davis, Sergio
Author
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Soto, Leopoldo
Admission date
dc.date.accessioned
2019-05-31T15:19:57Z
Available date
dc.date.available
2019-05-31T15:19:57Z
Publication date
dc.date.issued
2018
Cita de ítem
dc.identifier.citation
Journal of Physics: Conference Series, Volumen 1043, Issue 1, 2018
Identifier
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17426596
Identifier
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17426588
Identifier
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10.1088/1742-6596/1043/1/012049
Identifier
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https://repositorio.uchile.cl/handle/2250/169402
Abstract
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The Plasma Focus (PF) is a kind of dense transient plasmas in with high-pulsed voltage. To produce devices for eld application it is necessary to obtain PF equipment able to operate for a long period of time. Thus, a reliability analysis is indispensable. In this work a reliability analysis program for plasma focus devices is presented. The program considers a criticality analysis using Failure Modes and Effects Criticality Analysis (FMECA) to identify the most important failure modes of the system. Said failure modes are studied operating the Plasma Focus for many cycles, obtaining from them the characteristic curves of V(t) and İ(t). Feature Extraction (FE) techniques are applied to obtain a list of parameters that correlate to the degrading process. Furthermore, Machine Learning tools are used to learn from the obtained data, linking the changes in these parameters during its life cycle to the decay of the system in hope for future implementation of a predictive maintenance system and a reference for data analysis and prediction in PFs. The study was applied to a portable plasma focus device operated at 2 joules of stored energy.