Two-level genetic algorithm for evolving convolutional neural networks for pattern recognition
Author
dc.contributor.author
Montecino, Daniel A.
Author
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Pérez, Claudio A.
Author
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Bowyer, Kevin W.
Admission date
dc.date.accessioned
2022-10-20T17:25:44Z
Available date
dc.date.available
2022-10-20T17:25:44Z
Publication date
dc.date.issued
2021
Cita de ítem
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IEEE Access (2021) Vol. 9 págs. 126856-126872
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Identifier
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10.1109/ACCESS.2021.3111175
Identifier
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https://repositorio.uchile.cl/handle/2250/188726
Abstract
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The aim of Neuroevolution is to nd neural networks and convolutional neural network (CNN)
architectures automatically through evolutionary algorithms. A crucial problem in neuroevolution is search
time, since multiple CNNs must be trained during evolution. This problem has led to tness acceleration
approaches, generating a trade-off between time and tness delity. Also, since search spaces for this
problem usually include only a few parameters, this increases the human bias in the search. In this work,
we propose a novel two-level genetic algorithm (GA) for addressing the delity-time trade-off problem
for the tness computation in CNNs. The rst level evaluates many individuals quickly, and the second
evaluates only those with the best results more nely. We also propose a search space with few restrictions,
and an encoding with unexpressed genes to facilitate the crossover operation. This search space allows CNN
architectures to have any sizes, shapes, and skip-connections among nodes. The two-level GA was applied
to the pattern recognition problem on seven datasets, ve MNIST-Variants, Fashion-MNIST, and CIFAR-10,
achieving signi cantly better results than all those previously published. Our results show an improvement
of 39.89% (4.2% error reduction) on the most complex dataset of MNIST (MRDBI), and on average 30.52%
(1.35% error reduction) on all the ve datasets. Furthermore, we show that our algorithm performed as well
as precise-training GA, but took only the time of a fast-training GA. These results can be relevant and useful
not only for image classi cation problems but also for GA-related problems.
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Patrocinador
dc.description.sponsorship
Agencia Nacional de Investigacion y Desarrollo (ANID) FONDECYT 1191610
AFB180004
Department of Electrical Engineering, Universidad de Chile
Advanced Mining Technology Center, Universidad de Chile
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Lenguage
dc.language.iso
en
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Publisher
dc.publisher
IEEE-Inst Electrical Electronics Engineers
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Type of license
dc.rights
Attribution-NonCommercial-NoDerivs 3.0 United States