Now showing items 181-200 of 7550

    • Meneses J., Mendoza-Araya P. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Espina E., Burgos-Mellado C., Gomez J.S., Llanos J., Rute E., Alex Navas F., Martinez-Gomez M., Cardenas R., Sacz D. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Badilla P., Bravo-Marquez F., Pérez J. (International Joint Conferences on Artificial Intelligence, 2020)
    • Hecht G., Neverov C., Bergel A. (Association for Computing Machinery, Inc, 2020)
    • Pereira-Bonvallet E., Moreno R., Muñoz F.D. (Springer Nature, 2020)
    • Vidal-Silva, N; Aguilera, E; Roldan-Molina, A; Duine, RA; Nunez, AS (American Physical Societysubs@aip.org;revtex@aps.org;prx@aps.org;prxtex@aps.org;help@aps.org;prb@aps.org, 2020)
    • Bernales, A; Verousis, T; Voukelatos, N; Zhang, MY (Wiley-Liss Inc.info@wiley.com, 2020)
    • Paykari, P; Kitching, T; Hoekstra, H; Azzollini, R; Cardone, VF; Cropper, M; Duncan, CAJ; Kannawadi, A; Miller, L; Aussel, H; Conti, IF; Auricchio, N; Baldi, M; Bardelli, S; Biviano, A; Bonino, D; Borsato, E; Bozzo, E; Branchini, E; Brau-Nogue, S; Brescia, M; Brinchmann, J; Burigana, C; Camera, S; Capobianco, V; Carbone, C; Carretero, J; Casas, S; Castander, FJ; Castellano, M; Cavuoti, S; Charles, Y; Cledassou, R; Colodro-Conde, C; Congedo, G; Conselice, C; Conversi, L; Copin, Y; Coupon, J; Courtois, HM; Da Silva, A; Dupac, X; Fabbian, G; Farrens, S; Ferreira, PG; Fosalba, P; Fourmanoit, N; Frailis, M; Fumana, M; Galeotta, S; Garilli, B; Gillard, W; Gillis, BR; Giocoli, C; Gracia-Carpio, J; Grupp, F; Hormuth, F; Ilic, S; Israel, H; Jahnke, K; Keihanen, E; Kermiche, S; Kilbinger, M; Kirkpatrick, CC; Kubik, B; Kunz, M; Kurki-Suonio, H; Lacasa, F; Laureijs, R; Le Mignant, D; Le Mignant, D; Lilje, PB; Lloro, I; Maciaszek, T; Maiorano, E; Marggraf, O; Markovic, K; Martinelli, M; Martinet, N; Marulli, F; Massey, R; Mauri, N; Medinaceli, E; Mei, S; Mellier, Y; Meneghetti, M; Metcalf, RB; Moresco, M; Moscardini, L; Munari, E; Neissner, C; Nichol, RC; Niemi, S; Nutma, T; Padilla, C; Paltani, S; Pasian, F; Pettorino, V; Pires, S; Polenta, G; Pourtsidou, A; Raison, F; Renzi, A; Rhodes, J; Romelli, E; Roncarelli, M; Rossetti, E; Saglia, R; Sakr, Z; Sanchez, AG; Sapone, D; Scaramella, R; Schneider, P; Schrabback, T; Scottez, V; Secroun, A; Serrano, S; Sirignano, C; Sirri, G; Stanco, L; Starck, JL; Sureau, F; Tallada-Crespi, P; Taylor, A; Tenti, M; Tereno, I; Toledo-Moreo, R; Torradeflot, F; Tutusaus, I; Valenziano, L; Vannier, M; Vassallo, T; Zoubian, J; Zucca, E (EDP Sciencessubscribers@edpsciences.org, 2020)
    • Villasenor, T; Tentori, D; Marsaglia, KM; Pinto, L (Blackwell Publishing Ltdinfo@royensoc.co.uk, 2020)
    • Cruz N., Ruiz-Del-Solar J. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Tapia N.I., Estevez P.A. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Tapia N.I., Estevez P.A. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Carleo, I; Gandolfi, D; Barragan, O; Livingston, JH; Persson, CM; Lam, KWF; Vidotto, A; Lund, MB; D'Angelo, CV; Collins, KA; Fossati, L; Howard, AW; Kubyshkina, D; Brahm, R; Oklopcic, A; Molliere, P; Redfield, S; Serrano, LM; Dai, F; Fridlund, M; Borsa, F; Korth, J; Esposito, M; Diaz, MR; Nielsen, LD; Hellier, C; Mathur, S; Deeg, HJ; Hatzes, AP; Benatti, S; Rodler, F; Alarcon, J; Spina, L; Santos, ARG; Georgieva, I; Garcia, RA; Gonzalez-Cuesta, L; Ricker, GR; Vanderspek, R; Latham, DW; Seager, S; Winn, JN; Jenkins, JM; Albrecht, S; Batalha, NM; Beard, C; Boyd, PT; Bouchy, F; Burt, JA; Butler, RP; Cabrera, J; Chontos, A; Ciardi, DR; Cochran, WD; Collins, KI; Crane, JD; Crossfield, I; Csizmadia, S; Dragomir, D; Dressing, C; Eigmuller, P; Endl, M; Erikson, A; Espinoza, N; Fausnaugh, M; Feng, FB; Flowers, E; Fulton, B; Gonzales, EJ; Grieves, N; Grziwa, S; Guenther, EW; Guerrero, NM; Henning, T; Hidalgo, D; Hirano, T; Hjorth, M; Huber, D; Isaacson, H; Jones, M; Jordan, A; Kabath, P; Kane, SR; Knudstrup, E; Lubin, J; Luque, R; Mireles, I; Narita, N; Nespral, D; Niraula, P; Nowak, G; Palle, E; Patzold, M; Petigura, EA; Prieto-Arranz, J; Rauer, H; Robertson, P; Rose, ME; Roy, A; Sarkis, P; Schlieder, JE; Segransan, D; Shectman, S; Skarka, M; Smith, AMS; Smith, JC; Stassun, K; Teske, J; Twicken, JD; Van Eylen, V; Wang, SR; Weiss, LM; Wyttenbach, A (IOP Publishing Ltdcustserv@iop.org, 2020)
    • Reyes E., Estevez P.A. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Lictevout, E; Abellanosa, C; Maass, C; Perez, N; Yanez, G; Veronique, L (Servicio Nacional de Geologia y Mineriamcortes@sernageomin.cl, 2020)
    • Calisto E., Clerc M.G., Zambra V. (SPIEjournals@spie.org, 2020)
    • Jativa P.P., Azurdia-Meza C.A., Canizares M.R., Zabala-Blanco D., Montejo-Sanchez S. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Villaseñor T., Celis S., Queupil J.P., Pinto L., Rojas M. (Copernicus GmbH info@copernicus.org, 2020)
    • Guajardo-Penroz C., Soto I., San-Juan E., Adasme P., Azurdia-Meza C., Zabala-Blanco D. (Institute of Electrical and Electronics Engineers Inc., 2020)
    • Jenkins, JS; Diaz, MR; Kurtovic, NT; Espinoza, N; Vines, JI; Rojas, PAP; Brahm, R; Torres, P; Cortes-Zuleta, P; Soto, MG; Lopez, ED; King, GW; Wheatley, PJ; Winn, JN; Ciardi, DR; Ricker, G; Vanderspek, R; Latham, DW; Seager, S; Jenkins, JM; Beichman, CA; Bieryla, A; Burke, CJ; Christiansen, JL; Henze, CE; Klaus, TC; McCauliff, S; Mori, M; Narita, N; Nishiumi, T; Tamura, M; de Leon, JP; Quinn, SN; Villasenor, JN; Vezie, M; Lissauer, JJ; Collins, KA; Collins, KI; Isopi, G; Mallia, F; Ercolino, A; Petrovich, C; Jordan, A; Acton, JS; Armstrong, DJ; Bayliss, D; Bouchy, F; Belardi, C; Bryant, EM; Burleigh, MR; Cabrera, J; Casewell, SL; Chaushev, A; Cooke, BF; Eigmuller, P; Erikson, A; Foxell, E; Gansicke, BT; Gill, S; Gillen, E; Gunther, MN; Goad, MR; Hooton, MJ; Jackman, JAG; Louden, T; McCormac, J; Moyano, M; Nielsen, LD; Pollacco, D; Queloz, D; Rauer, H; Raynard, L; Smith, AMS; Tilbrook, RH; Titz-Weider, R; Turner, O; Udry, S; Walker, SR; Watson, CA; West, RG; Palle, E; Ziegler, C; Law, N; Mann, AW (Nature Research, 2020)