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Authordc.contributor.authorCarmona, Emerson M. 
Authordc.contributor.authorPeter Larsson, H. 
Authordc.contributor.authorNeely, Alan 
Authordc.contributor.authorAlvarez, Osvaldo 
Authordc.contributor.authorLatorre, Ramón 
Authordc.contributor.authorGonzalez, Carlos 
Admission datedc.date.accessioned2018-12-20T14:22:53Z
Available datedc.date.available2018-12-20T14:22:53Z
Publication datedc.date.issued2018
Cita de ítemdc.identifier.citationProceedings of the National Academy of Sciences of the United States of America, Volumen 115, Issue 37, 2018, Pages 9240-9245
Identifierdc.identifier.issn10916490
Identifierdc.identifier.issn00278424
Identifierdc.identifier.other10.1073/pnas.1809705115
Identifierdc.identifier.urihttps://repositorio.uchile.cl/handle/2250/155786
Abstractdc.description.abstract© 2018 National Academy of Sciences. All Rights Reserved. The voltage-gated proton (Hv1) channel, a voltage sensor and a conductive pore contained in one structural module, plays important roles in many physiological processes. Voltage sensor movements can be directly detected by measuring gating currents, and a detailed characterization of Hv1 charge displacements during channel activation can help to understand the function of this channel. We succeeded in detecting gating currents in the monomeric form of the Ciona-Hv1 channel. To decrease proton currents and better separate gating currents from ion currents, we used the low-conducting Hv1 mutant N264R. Isolated ON-gating currents decayed at increasing rates with increasing membrane depolarization, and the amount of gating charges displaced saturates at high voltages. These are two hallmarks of currents arising from the movement of charged elements within the boundaries of the cell membrane. The kinetic analysis of gating currents r
Lenguagedc.language.isoen
Publisherdc.publisherNational Academy of Sciences
Type of licensedc.rightsAttribution-NonCommercial-NoDerivs 3.0 Chile
Link to Licensedc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/
Sourcedc.sourceProceedings of the National Academy of Sciences of the United States of America
Keywordsdc.subjectGating currents
Keywordsdc.subjectHv1 proton channel
Keywordsdc.subjectKinetic model
Keywordsdc.subjectTrapping
Keywordsdc.subjectVoltage sensor
Títulodc.titleGating charge displacement in a monomeric voltage-gated proton (Hv1) channel
Document typedc.typeArtículo de revista
Catalogueruchile.catalogadorSCOPUS
Indexationuchile.indexArtículo de publicación SCOPUS
uchile.cosechauchile.cosechaSI


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Attribution-NonCommercial-NoDerivs 3.0 Chile
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 Chile