Now showing items 1-3 of 3

    • Henríquez, Ricardo; Cancino, Simón; Espinosa, Andrés; Flores Carrasco, Marcos; Hoffmann, Michael; Kremer Erdmann, Germán; Lisoni Reyes, Judith; Moraga, Luis; Morales, Roberto; Oyarzún, Simón; Suárez, Marco; Zúñiga Páez, Alejandro; Muñoz Alvarado, Raúl (AMER PHYSICAL SOC, 2010-09-23)
      The resistivity of metallic structures depends on both electron-grain boundary scattering and electron-surface scattering. By tuning the grain size, we have been able to separate the contribution to the resistivity ...
    • Robles, Marcelo E.; González Fuentes, Claudio A.; Henríquez, Ricardo; Kremer Erdmann, Germán; Moraga, Luis; Oyarzún, Simón; Suárez, Marco Antonio; Flores Carrasco, Marcos; Muñoz Alvarado, Raúl (Elsevier, 2012)
      We report a comparison between the resistivity measured on thin gold films deposited on mica, with predictions based upon classical theories of size effects (Drude’s, Sondheimer’s and Calecki’s), as well as predictions ...
    • Oyarzún, Simón; Henríquez, Ricardo; Suárez, Marco Antonio; Moraga, Luis; Kremer, Germán; Munoz, Raúl C. (2014)
      We report new experimental data regarding the transverse magnetoresistance measured in a family of thin gold films of different thickness with the electric field E oriented perpendicular to the magnetic field B (both fields ...