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Authordc.contributor.authorMoraga, 
Admission datedc.date.accessioned2019-01-29T14:13:52Z
Available datedc.date.available2019-01-29T14:13:52Z
Publication datedc.date.issued1990
Cita de ítemdc.identifier.citationJournal of Physics: Condensed Matter, Volumen 2, Issue 16, 2018, Pages 3777-3795
Identifierdc.identifier.issn09538984
Identifierdc.identifier.other10.1088/0953-8984/2/16/008
Identifierdc.identifier.urihttps://repositorio.uchile.cl/handle/2250/160239
Abstractdc.description.abstractThe Schrodinger equation for an electron near a randomly rough metal-metal (or metal-vacuum) interface is approximately solved. The wavefunction and probability currents are averaged over all realisations of the interface characterised by its root-mean-square departure from flatness and the extent of its lateral correlation, and the results are used to set up simple boundary conditions for the Boltzmann transport equation. These are in the form of angle-dependent transmission and reflection coefficients, generalising Fuch's reflectivity parameter, but given as explicit functions of observable properties of the interface. These results are further applied to the calculation of the electrical conductivity of thin films and foils, and of double-layer metallic films.
Lenguagedc.language.isoen
Type of licensedc.rightsAttribution-NonCommercial-NoDerivs 3.0 Chile
Link to Licensedc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/
Sourcedc.sourceJournal of Physics: Condensed Matter
Keywordsdc.subjectMaterials Science (all)
Keywordsdc.subjectCondensed Matter Physics
Títulodc.titleTheory of electrical transport and scattering at a metal-metal interface
Document typedc.typeArtículo de revista
Catalogueruchile.catalogadorSCOPUS
Indexationuchile.indexArtículo de publicación SCOPUS
uchile.cosechauchile.cosechaSI


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Attribution-NonCommercial-NoDerivs 3.0 Chile
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 Chile