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Authordc.contributor.authorSepúlveda, Luis 
Authordc.contributor.authorCortés, Juan 
Admission datedc.date.accessioned2019-01-29T15:34:36Z
Available datedc.date.available2019-01-29T15:34:36Z
Publication datedc.date.issued1985
Cita de ítemdc.identifier.citationJournal of Physical Chemistry, Volumen 89, Issue 24, 2018, Pages 5322-5324
Identifierdc.identifier.issn00223654
Identifierdc.identifier.other10.1021/j100270a040
Identifierdc.identifier.urihttps://repositorio.uchile.cl/handle/2250/161672
Abstractdc.description.abstractIonization degrees (α) of micelles of hexadecyltrimethylammonium (CTAX) and tetradecyltrimethylammonium (TTAX) (X = OH-, Br-, Cl-, NO3 -, SO4 2-, and CO3 2-) were measured by a modified free electrophoresis method and by Evan's method. Cmc values for the CTAX and TTAX surfactants were also measured. Whenever possible the α and cmc values thus obtained were compared with those reported in the literature. © 1985 American Chemical Society.
Lenguagedc.language.isoen
Type of licensedc.rightsAttribution-NonCommercial-NoDerivs 3.0 Chile
Link to Licensedc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/
Sourcedc.sourceJournal of Physical Chemistry
Keywordsdc.subjectEngineering (all)
Keywordsdc.subjectPhysical and Theoretical Chemistry
Títulodc.titleIonization degrees and critical micelle concentrations of hexadecyltrimethylammonium and tetradecyltrimethylammonium micelles with different counterions
Document typedc.typeArtículo de revista
Catalogueruchile.catalogadorSCOPUS
Indexationuchile.indexArtículo de publicación SCOPUS
uchile.cosechauchile.cosechaSI


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Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 Chile