Aleph: An indicator of decision-making patterns within collaborative marking sessions for writing assessment that can predict reliability
| Author | dc.contributor.author | Herrera N., Villalon J., Munoz G., Baez G. | |
| Admission date | dc.date.accessioned | 2022-12-27T14:03:18Z | |
| Available date | dc.date.available | 2022-12-27T14:03:18Z | |
| Publication date | dc.date.issued | 2020 | |
| Identifier | dc.identifier.other | 10.1109/ICALT49669.2020.00041 | |
| Identifier | dc.identifier.uri | https://repositorio.uchile.cl/handle/2250/190788 | |
| Lenguage | dc.language.iso | en | |
| Publisher | dc.publisher | Institute of Electrical and Electronics Engineers Inc. | |
| Type of license | dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Chile | |
| Link to License | dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/cl/ | |
| Source | dc.source | Proceedings - IEEE 20th International Conference on Advanced Learning Technologies, ICALT 2020 | |
| Título | dc.title | Aleph: An indicator of decision-making patterns within collaborative marking sessions for writing assessment that can predict reliability | |
| Document type | dc.type | Artículo de revista | |
| Cataloguer | uchile.catalogador | SCOPUS | |
| Indexation | uchile.index | Artículo de publicación ISI | |
| Indexation | uchile.index | Artículo de publicación SCOPUS | |
| Indexation | uchile.index | Artículo de publicación SCIELO | |
| uchile.cosecha | uchile.cosecha | SI |
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Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 Chile