Browsing by Author "b2295e80-bff8-4a83-bbf8-62adbee9dcff"
Now showing items 1-8 of 8
-
Munoz, Raúl C.; Concha, Andres; Mora, Fernando; Espejo, Roberto; Vidal, Guillermo; Mulsow, Marcelo; Arenas, Claudio (2000)We report measurements of the topography of a gold film deposited on a mica substrate using scanning tunneling microscope (STM), and measurements of the conductivity σ of the film performed between 4 and 300 K. From images ...
-
Munoz, Raúl C.; Vidal, Guillermo; Mulsow, Marcelo; Lisoni, Judit G.; Arenas, Claudio; Concha, Andres; Mora, Fernando; Espejo, Roberto; Kremer, Germán; Moraga, Luis (2000)We report measurements of the resistivity (Formula presented) of a gold film 70 nm thick deposited on mica preheated to 300 °C in UHV, performed between 4 and 300 K, and measurements of the surface topography of the same ...
-
Munoz, Raúl C.; Vidal, Guillermo; Kremer, Germán; Moraga, Luis; Arenas, Claudio; Concha, Andres (2000)We report measurements of the temperature dependent resistivity ρ(T) of a gold film 70 nm thick deposited on mica preheated to 300°C in UHV, performed between 4 K and 300 K, and measurements of the surface topography of ...
-
Munoz, Raul C.; Arenas, Claudio; Kremer, Germán; Moraga, Luis (IOP, 2000)We analyze the thickness and temperature dependence of the resistivity for several gold films on mica reported by Sambles, Elsom and Jarvis. Data analysis proceeds according to an iteration procedure proposed recently, ...
-
Munoz, Raúl C.; Vidal, Guillermo; Kremer, Germán; Moraga, Luis; Arenas, Claudio (1999)We report an extension of the theory of Sheng, Xing and Wang (SXW) (Sheng L, Xing D Y and Wang Z D 1995 Phys. Rev. B 51 7325), which permits the calculation of size effects from the statistical properties that characterize ...
-
Munoz, Raúl C.; Finger, Ricardo; Arenas, Claudio; Kremer, German; Moraga, Luis (2002)We have extended the modified formalism of Sheng, Xing, and Wang [J. Phys.: Condens. Matter 11 L299 (1999)] to allow the calculation of the conductivity of a thin metallic film bounded by a rough fractal surface. We utilized ...
-
Munoz, Raúl C.; Finger, Ricardo; Arenas, Claudio; Kremer, German; Moraga, Luis (2002)We have extended the modified formalism of Sheng, Xing, and Wang [J. Phys.: Condens. Matter 11 L299 (1999)] to allow the calculation of the conductivity of a thin metallic film bounded by a rough fractal surface. We utilized ...
-
Arenas, Claudio; Herrera Huerta, Guillermo; Muñoz, Enrique; Muñoz Alvarado, Raúl (IOP, 2021)We report the resistivity measured at temperatures between 5 K and 300 K of a Cu film 63 nm thick with grains that have a diameter d = 10.5 nm on the average. The resistivity of this film is described by the first quantum ...