Browsing by Author "Sebastian, T."

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    • Parameter-free determination of the exchange constant in thin films using magnonic patterning 
      Langer, M.; Wagner, K.; Sebastian, T.; Huebner, R.; Grenzer, J.; Wang, Yutian; Kubota, T.; Schneider, T.; Stienen, S.; Lenz, K.; Schultheiss, H.; Lindner, J.; Takanashi, K.; Arias Federici, Rodrigo; Fassbender, J. (AMER INST PHYSICS, 2016)
      An all-electrical method is presented to determine the exchange constant of magnetic thin films using ferromagnetic resonance. For films of 20 nm thickness and below, the determination of the exchange constant A, a fundamental ...