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Authordc.contributor.authorRuiz del Solar, Javier 
Authordc.contributor.authorLoncomilla, Patricio es_CL
Authordc.contributor.authorDevia, Christ es_CL
Admission datedc.date.accessioned2012-12-18T20:34:35Z
Available datedc.date.available2012-12-18T20:34:35Z
Publication datedc.date.issued2008
Cita de ítemdc.identifier.citationJ. Ruiz-Shulcloper and W.G. Kropatsch (Eds.): CIARP 2008, LNCS 5197, pp. 519–526, 2008.es_CL
Identifierdc.identifier.urihttps://repositorio.uchile.cl/handle/2250/125706
Abstractdc.description.abstractA new approach to automatic fingerprint verification based on a general- purpose wide baseline matching methodology is here proposed. The approach is not based on the standard ridge-minutiae-based framework. Instead of detecting and matching the standard structural features, local interest points are detected in the fingerprints, then local descriptors are computed in the neighborhood of these points, and afterwards these descriptors are compared using local and global matching procedures. Then, a final verification is carried out by a Bayes classifier. The methodology is validated using the FVC2004 dataset, where competitive results are obtained.es_CL
Patrocinadordc.description.sponsorshipThis research was funded by Millennium Nucleus Center for Web Research, Grant P04-067-F, Chile.es_CL
Lenguagedc.language.isoenes_CL
Publisherdc.publisherSpringer-Verlages_CL
Keywordsdc.subjectFingerprint verificationes_CL
Títulodc.titleFingerprint Verification Using Local Interest Points and Descriptorses_CL
Document typedc.typeArtículo de revista


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