Surface-induced resistivity of gold films on mica: Comparison between the classical and the quantum theory
Author
dc.contributor.author
Munoz, Raúl C.
Author
dc.contributor.author
Vidal, Guillermo
Author
dc.contributor.author
Kremer, Germán
Author
dc.contributor.author
Moraga, Luis
Author
dc.contributor.author
Arenas, Claudio
Admission date
dc.date.accessioned
2018-12-20T14:37:51Z
Available date
dc.date.available
2018-12-20T14:37:51Z
Publication date
dc.date.issued
1999
Cita de ítem
dc.identifier.citation
Journal of Physics Condensed Matter, Volumen 11, Issue 26, 2018,
Identifier
dc.identifier.issn
09538984
Identifier
dc.identifier.other
10.1088/0953-8984/11/26/102
Identifier
dc.identifier.uri
https://repositorio.uchile.cl/handle/2250/156722
Abstract
dc.description.abstract
We report an extension of the theory of Sheng, Xing and Wang (SXW) (Sheng L, Xing D Y and Wang Z D 1995 Phys. Rev. B 51 7325), which permits the calculation of size effects from the statistical properties that characterize the surface on a microscopic scale, for samples in which the average height-height autocorrelation function (ACF) is described either by a Gaussian or by an exponential. We also report measurements of the topography of a gold film deposited on a mica substrate using a scanning tunnelling microscope (STM) on a gold sample 70 nm thick deposited under ultrahigh vacuum on a mica substrate preheated to 300°C. From the STM images we compute the average ACF which characterizes the surface of the film on the scale of 10 nm × 10 nm, and determine by least-squares fitting the r.m.s. amplitude δ and the lateral correlation length ξ corresponding to a Gaussian and to an exponential that best represent the ACF data. Using the modified SXW (mSXW) theory and a Gaussian and an expon