Atomic-scale imaging of polarization switching in an (anti-)ferroelectric memory material: Zirconia (ZrO2)
Author
dc.contributor.author
Lombardo S., Nelson C., Chae K., Reyes-Lillo S., Tian M., Tasneem N., Wang Z., Hoffmann M., Triyoso D., Consiglio S., Tapily K., Clark R., Leusink G., Cho K., Kummel A., Kacher J., Khan A.
Admission date
dc.date.accessioned
2022-12-27T13:57:39Z
Available date
dc.date.available
2022-12-27T13:57:39Z
Publication date
dc.date.issued
2020
Identifier
dc.identifier.issn
07431562
Identifier
dc.identifier.other
10.1109/VLSITechnology18217.2020.9265091
Identifier
dc.identifier.uri
https://repositorio.uchile.cl/handle/2250/190487
Lenguage
dc.language.iso
en
Publisher
dc.publisher
Institute of Electrical and Electronics Engineers Inc.