Author | dc.contributor.author | Henríquez, Ricardo | |
Author | dc.contributor.author | Cancino, Simón | es_CL |
Author | dc.contributor.author | Espinosa, Andrés | es_CL |
Author | dc.contributor.author | Flores Carrasco, Marcos | es_CL |
Author | dc.contributor.author | Hoffmann, Michael | es_CL |
Author | dc.contributor.author | Kremer Erdmann, Germán | es_CL |
Author | dc.contributor.author | Lisoni Reyes, Judith | es_CL |
Author | dc.contributor.author | Moraga, Luis | es_CL |
Author | dc.contributor.author | Morales, Roberto | es_CL |
Author | dc.contributor.author | Oyarzún, Simón | es_CL |
Author | dc.contributor.author | Suárez, Marco | es_CL |
Author | dc.contributor.author | Zúñiga Páez, Alejandro | es_CL |
Author | dc.contributor.author | Muñoz Alvarado, Raúl | es_CL |
Admission date | dc.date.accessioned | 2011-06-03T14:55:46Z | |
Available date | dc.date.available | 2011-06-03T14:55:46Z | |
Publication date | dc.date.issued | 2010-09-23 | |
Cita de ítem | dc.identifier.citation | PHYSICAL REVIEW B, Volume: 82, Issue: 11, Article Number: 113409, 2010 | es_CL |
Identifier | dc.identifier.issn | 1098-0121 | |
Identifier | dc.identifier.uri | https://repositorio.uchile.cl/handle/2250/119229 | |
General note | dc.description | Artículo de publicación ISI | es_CL |
Abstract | dc.description.abstract | The resistivity of metallic structures depends on both electron-grain boundary scattering and electron-surface
scattering. By tuning the grain size, we have been able to separate the contribution to the resistivity originating
in electron-grain boundary scattering, from that arising in electron-surface scattering, on gold films approximately
54 nm thick deposited onto mica substrates under high vacuum. Surprisingly, the resistivity measured
between 4 and 300 K can be described by Drude’s model; it can be described as well by Mayadas’s theory
using the grain boundary reflectivity R as the only adjustable parameter. | es_CL |
Patrocinador | dc.description.sponsorship | Work supported by FONDECYT under Contract No.
1085026. | es_CL |
Lenguage | dc.language.iso | en | es_CL |
Publisher | dc.publisher | AMER PHYSICAL SOC | es_CL |
Keywords | dc.subject | GOLD-FILMS | es_CL |
Título | dc.title | Electron grain boundary scattering and the resistivity of nanometric metallic structures | es_CL |
Document type | dc.type | Artículo de revista | |