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Authordc.contributor.authorHenríquez, Ricardo 
Authordc.contributor.authorCancino, Simón es_CL
Authordc.contributor.authorEspinosa, Andrés es_CL
Authordc.contributor.authorFlores Carrasco, Marcos es_CL
Authordc.contributor.authorHoffmann, Michael es_CL
Authordc.contributor.authorKremer Erdmann, Germán es_CL
Authordc.contributor.authorLisoni Reyes, Judith es_CL
Authordc.contributor.authorMoraga, Luis es_CL
Authordc.contributor.authorMorales, Roberto es_CL
Authordc.contributor.authorOyarzún, Simón es_CL
Authordc.contributor.authorSuárez, Marco es_CL
Authordc.contributor.authorZúñiga Páez, Alejandro es_CL
Authordc.contributor.authorMuñoz Alvarado, Raúl es_CL
Admission datedc.date.accessioned2011-06-03T14:55:46Z
Available datedc.date.available2011-06-03T14:55:46Z
Publication datedc.date.issued2010-09-23
Cita de ítemdc.identifier.citationPHYSICAL REVIEW B, Volume: 82, Issue: 11, Article Number: 113409, 2010es_CL
Identifierdc.identifier.issn1098-0121
Identifierdc.identifier.urihttps://repositorio.uchile.cl/handle/2250/119229
General notedc.descriptionArtículo de publicación ISIes_CL
Abstractdc.description.abstractThe resistivity of metallic structures depends on both electron-grain boundary scattering and electron-surface scattering. By tuning the grain size, we have been able to separate the contribution to the resistivity originating in electron-grain boundary scattering, from that arising in electron-surface scattering, on gold films approximately 54 nm thick deposited onto mica substrates under high vacuum. Surprisingly, the resistivity measured between 4 and 300 K can be described by Drude’s model; it can be described as well by Mayadas’s theory using the grain boundary reflectivity R as the only adjustable parameter.es_CL
Patrocinadordc.description.sponsorshipWork supported by FONDECYT under Contract No. 1085026.es_CL
Lenguagedc.language.isoenes_CL
Publisherdc.publisherAMER PHYSICAL SOCes_CL
Keywordsdc.subjectGOLD-FILMSes_CL
Títulodc.titleElectron grain boundary scattering and the resistivity of nanometric metallic structureses_CL
Document typedc.typeArtículo de revista


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