An indirect method to measure the electric charge deposited on insulators during PIXE analysis
| Author | dc.contributor.author | Dinator, M. I. | |
| Author | dc.contributor.author | Cancino, S. A. | |
| Author | dc.contributor.author | Miranda, P. A. | |
| Author | dc.contributor.author | Morales, J. R. | |
| Author | dc.contributor.author | Seelenfreund, A. | |
| Admission date | dc.date.accessioned | 2018-12-20T14:11:41Z | |
| Available date | dc.date.available | 2018-12-20T14:11:41Z | |
| Publication date | dc.date.issued | 2007 | |
| Cita de ítem | dc.identifier.citation | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Volumen 263, Issue 2, 2018, Pages 529-531 | |
| Identifier | dc.identifier.issn | 0168583X | |
| Identifier | dc.identifier.other | 10.1016/j.nimb.2007.07.011 | |
| Identifier | dc.identifier.uri | https://repositorio.uchile.cl/handle/2250/154591 | |
| Abstract | dc.description.abstract | Total charge deposited by a proton beam in an insulator during PIXE analysis has been indirectly determined using a Mylar film coated with cobalt. Elemental concentrations in the samples, pieces of volcanic glass, were obtained and compared to concentrations determined by ICP OES on the same samples. The strong agreement between these results shows the accuracy of the charge determined by this method. © 2007 Elsevier B.V. All rights reserved. | |
| Lenguage | dc.language.iso | en | |
| Type of license | dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Chile | |
| Link to License | dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/cl/ | |
| Source | dc.source | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | |
| Keywords | dc.subject | Concentrations | |
| Keywords | dc.subject | Electric charge | |
| Keywords | dc.subject | Obsidian rock | |
| Keywords | dc.subject | PIXE | |
| Keywords | dc.subject | Thick target | |
| Título | dc.title | An indirect method to measure the electric charge deposited on insulators during PIXE analysis | |
| Document type | dc.type | Artículo de revista | |
| Cataloguer | uchile.catalogador | SCOPUS | |
| Indexation | uchile.index | Artículo de publicación SCOPUS | |
| uchile.cosecha | uchile.cosecha | SI |
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Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 Chile