An indirect method to measure the electric charge deposited on insulators during PIXE analysis
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An indirect method to measure the electric charge deposited on insulators during PIXE analysis
Abstract
Total charge deposited by a proton beam in an insulator during PIXE analysis has been indirectly determined using a Mylar film coated with cobalt. Elemental concentrations in the samples, pieces of volcanic glass, were obtained and compared to concentrations determined by ICP OES on the same samples. The strong agreement between these results shows the accuracy of the charge determined by this method. © 2007 Elsevier B.V. All rights reserved.
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Artículo de publicación SCOPUS
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URI: https://repositorio.uchile.cl/handle/2250/154591
DOI: 10.1016/j.nimb.2007.07.011
ISSN: 0168583X
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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Volumen 263, Issue 2, 2018, Pages 529-531
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